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* High-sensitive ultraviolet photoelectron spectroscopy (HSUPS) using MBS-A1 analyzer, monochromatized XeI light source, Omicron HIS13
* Angle-resolved ultraviolet photoelectron spectroscopy (ARUPS) using MBS-A1 analyzer, monochromatized XeI, HeI and HeII light sources, MBS-L1
* Two-photon photoemission spectroscopy (ARUPS) using MBS-A1 analyzer, fs/ps pulse laser, Mira-optima900D
* 5-axes manipulator (13K - 400 K)
* Inverse photoelectron spectroscopy (IPES), PSP
* Multi-channel plate low energy electron diffraction (MCPLEED), OCI
Features:
* High-sensitive detection of small DOS at band-gap region
* Photoelectron angular distribution, energy-momentum dispersion relation of the electronic structure
* Temperature/thickness dependent energy-level alignment at organic/inorganic interfaces
* Molecular beam epitaxy controlled by quartz microbalance
* Surface cleaning using Ar-ion sputter gun (LK), IR heater
D2 machine: Dynamics at surface and interfaces
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* Angle-resolved ultraviolet photoelectron spectroscopy (ARUPS) using SES200 analyzer, HeI light source, Omicron HIS13
* Two-photon photoemission spectroscopy (ARUPS) using SES200 analyzer, fs/ps pulse laser, Mira-optima900D
* Outermost-surface spectroscopy using He triplet metastable atom source
* 5-axes manipulator (13K - 400 K)
* Low-energy Inverse photoelectron spectroscopy (LEIPS), Adcap, bandpass 254-355 nm
* Spot-profile analysis low-energy electron diffraction (SPALEED) with variable temperature 13- 400 K, Omicron
* Low energy electron diffraction (LEED), OCI
Features:
* Temperature/thickness dependent energy-level alignment at organic/inorganic interfaces
* Final-state effects of unoccupied electronic states
* Molecular beam epitaxy controlled by quartz microbalance
* Surface cleaning using Ar-ion sputter gun (OCI), IR heater
G3 machine: Gas-phase electronic states
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* Ultraviolet photoelectron spectroscopy (UPS) using VG-CLAM4 analyzer, HeI light source, Omicron HIS13
* Homemade photoionization cell with a miniature container for molecules
Features:
* Gas-phase electronic states of low-vapor molecules
DA30 machine: Deflector analyzer
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* 2D angle-resolved ultraviolet photoelectron spectroscopy (ARUPS) using SCIENTA DA30 analyzer, monochromatized HeI and HeII light sources, VUV5050
* 5-axes manipulator (13K - 400 K) with 15-deg-off stage
* Multi-channel plate low energy electron diffraction (MCPLEED), OCI
* Ar-ion sputter gun, OCI
Features:
* Small-spot micro ARPES (0.3mm)
* Two-dimensional momentum map
Synchrotron based techniques
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Photoelectron momentum microscope (PMM): BL6U(UVSOR)
Aceptance-cone-tunable electron spectrometer (ACTES): BL6U(UVSOR)
Low-energy angle-resolved ultraviolet photoelectron spectroscopy (LE-ARUPS): BL7U(UVSOR)
high-resolution x-ray photoelectron spectroscopy (XPS)
Resonance auger photoelectron spectroscopy (RPES)
Near-edge x-ray absorption fine structure spectroscopy (NEXAFS)
X-ray standing wave spectroscopy (XSW): Diamond
Angle-resolved time-of-flight spectroscopy (ArTOF): BESSY
Momentum-resolved photoelectron emission microscopy (nano ESCA): ELETTRA